Coherence scanning interferometry

Coherence scanning interferometry (CSI) is any of a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure, and optical properties. CSI is currently the most common interference microscopy technique for areal surface topography measurement.{{cite journal | last1 = de Groot | first1 = P | year = 2015 | title = Principles of interference microscopy for the measurement of surface topography | doi = 10.1364/AOP.7.000001 | journal = Advances in Optics and Photonics | volume = 7 | issue = 1 | pages = 1–65 | bibcode = 2015AdOP....7....1D }} The term "CSI" was adopted by the International Organization for Standardization (ISO).ISO (2013). 25178-604:2013(E): Geometrical product specification (GPS) – Surface texture: Areal – Nominal characteristics of non-contact (coherence scanning interferometric microscopy) instruments (2013(E) ed.). Geneva: International Organization for Standardization.

File:Coherence scanning interferometry signal.jpg

The technique encompasses but is not limited to instruments that use spectrally broadband, visible sources (white light) to achieve interference fringe localization. CSI uses either fringe localization alone or in combination with interference fringe phase, depending on the surface type, desired surface topography repeatability and software capabilities. The table below compiles alternative terms that conform at least in part to the above definition.

class="wikitable"
AcronymTermReference
CSICoherence scanning interferometry{{cite journal | last1 = Windecker | first1 = R. | last2 = Haible | first2 = P. | last3 = Tiziani | first3 = H. J. | year = 1995 | title = Fast Coherence Scanning Interferometry for Measuring Smooth, Rough and Spherical Surfaces | journal = Journal of Modern Optics | volume = 42 | issue = 10| pages = 2059–2069 | doi=10.1080/09500349514551791| bibcode = 1995JMOp...42.2059W }}
CPMCoherence probe microscope{{cite journal | last1 = Davidson | first1 = M. | last2 = Kaufman | first2 = K. | last3 = Mazor | first3 = I. | year = 1987 | title = The Coherence Probe Microscope | journal = Solid State Technology | volume = 30 | issue = 9| pages = 57–59 }}
CSMCoherence scanning microscope{{cite journal | last1 = Lee | first1 = B. S. | last2 = Strand | first2 = T. C. | year = 1990 | title = Profilometry with a coherence scanning microscope | journal = Appl Opt | volume = 29 | issue = 26| pages = 3784–3788 | doi=10.1364/ao.29.003784| pmid = 20567484 | bibcode = 1990ApOpt..29.3784L }}
CRCoherence radar{{cite journal | last1 = Dresel | first1 = T. | last2 = Häusler | first2 = G. | last3 = Venzke | first3 = H. | year = 1992 | title = Three-dimensional sensing of rough surfaces by coherence radar | journal = Applied Optics | volume = 31 | issue = 7| pages = 919–925 | doi=10.1364/ao.31.000919| pmid = 20720701 | bibcode = 1992ApOpt..31..919D }}
CCICoherence correlation interferometryLee-Bennett, I. (2004). Advances in non-contacting surface metrology. Optical Fabrication and Testing, OTuC1.
MCMMirau correlation microscope{{cite journal | last1 = Kino | first1 = G. S. | last2 = Chim | first2 = S. S. C. | year = 1990 | title = Mirau correlation microscope | journal = Applied Optics | volume = 29 | issue = 26| pages = 3775–83 | doi=10.1364/ao.29.003775| pmid = 20567483 | bibcode = 1990ApOpt..29.3775K }}
WLIWhite light interferometry{{cite journal | last1 = Larkin | first1 = K. G. | year = 1996 | title = Efficient nonlinear algorithm for envelope detection in white light interferometry | journal = Journal of the Optical Society of America A | volume = 13 | issue = 4| page = 832 | doi = 10.1364/josaa.13.000832 | bibcode = 1996JOSAA..13..832L | citeseerx = 10.1.1.190.4728 }}
WLSIWhite light scanning interferometryWyant, J. C. (September, 1993). How to extend interferometry for rough-surface tests. Laser Focus World, 131-135.
SWLIScanning white light interferometry{{cite journal | last1 = Deck | first1 = L. | last2 = de Groot | first2 = P. | year = 1994 | title = High-speed noncontact profiler based on scanning white-light interferometry | journal = Applied Optics | volume = 33 | issue = 31| pages = 7334–7338 | doi=10.1364/ao.33.007334| pmid = 20941290 | bibcode = 1994ApOpt..33.7334D }}
WLSWhite Light Scanner
WLPSIWhite light phase shifting interferometry{{cite journal | last1 = Schmit | first1 = J. | last2 = Olszak | first2 = A. G. | editor1-first = Katherine | editor1-last = Creath | editor2-first = Joanna | editor2-last = Schmit | year = 2002 | title = Challenges in white-light phase-shifting interferometry | bibcode = 2002SPIE.4777..118S | journal = Proc. SPIE | volume = 4777 | pages = 118–127 | doi = 10.1117/12.472211 | series = Interferometry XI: Techniques and Analysis | s2cid = 128892213 }}
VSIVertical scanning interferometry{{cite journal | last1 = Harasaki | first1 = A. | last2 = Schmit | first2 = J. | last3 = Wyant | first3 = J. C. | year = 2000 | title = Improved vertical-scanning interferometry | journal = Applied Optics | volume = 39 | issue = 13| pages = 2107–2115 | doi=10.1364/ao.39.002107| pmid = 18345114 | bibcode = 2000ApOpt..39.2107H | hdl = 10150/289148 | hdl-access = free }}
RSPRough surface profiler{{cite journal | last1 = Caber | first1 = P. J. | year = 1993 | title = Interferometric profiler for rough surfaces | journal = Appl Opt | volume = 32 | issue = 19| pages = 3438–3441 | doi=10.1364/ao.32.003438| pmid = 20829962 | bibcode = 1993ApOpt..32.3438C}}
IRSInfrared scanning{{cite journal | last1 = De Groot | first1 = P. | last2 = Biegen | first2 = J. | last3 = Clark | first3 = J. | last4 = Colonna | last5 = de Lega | first5 = X. | last6 = Grigg | first6 = D. | year = 2002 | title = Optical Interferometry for Measurement of the Geometric Dimensions of Industrial Parts | journal = Applied Optics | volume = 41 | issue = 19| pages = 3853–3860 | doi=10.1364/ao.41.003853| pmid = 12099592 | bibcode = 2002ApOpt..41.3853D }}
OCTFull-field optical coherence tomography{{cite journal | last1 = Dubois | first1 = A | last2 = Vabre | first2 = L | last3 = Boccara | first3 = AC | last4 = Beaurepaire | first4 = E | year = 2002 | title = High-resolution full-field optical coherence tomography with a Linnik microscope | journal = Applied Optics | volume = 41 | issue = 4| pages = 805–12 | doi=10.1364/ao.41.000805 | pmid=11993929| bibcode = 2002ApOpt..41..805D }}

References