ISO/IEC JTC 1/SC 42

ISO/IEC JTC 1/SC 42 Artificial Intelligence is a standardization subcommittee of the Joint Technical Committee ISO/IEC JTC 1 of the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC).{{Cite web|url=https://www.brookings.edu/research/strengthening-international-cooperation-on-artificial-intelligence/|title=

Strengthening international cooperation on artificial intelligence|website=www.brookings.edu/|language=en|access-date=2023-04-25}} ISO/IEC JTC 1/SC 42 develops and facilitates the development of international standards, technical reports, and technical specifications within the fields of Artificial Intelligence (AI).{{Cite web|url=https://www.raps.org/news-and-articles/news-articles/2021/6/enabling-the-digital-transformation-of-industry-th|title=

Enabling the digital transformation of industry: The roles of AI, big data, analytics, and related data ecosystem|website=www.raps.org/|language=en|access-date=2023-04-24}} The international secretariat of ISO/IEC JTC 1/SC 42 is the American National Standards Institute (ANSI), located in the United States of America. The Chair of SC 42 is Wael William Diab.{{Cite web|url=https://www.iec.ch/dyn/www/f?p=103:7:216688589160647::::FSP_ORG_ID,FSP_LANG_ID:21538,25|website=www.iec.ch|title=ISO/IEC JTC 1/ SC 42|language=en|access-date=2023-04-24}} The first meeting of the committee took place in Beijing, China in April 2018.{{Cite news|url=https://www.iecetech.org/Technical-Committees/2018-03/First-International-Standards-committee-for-entire-AI-ecosystem|title=First International Standards committee for entire AI ecosystem {{!}} IEC e-tech {{!}} Issue' 03/2018|work=IEC e-tech|access-date=2018-08-23|language=en-US}}{{dead link|date=March 2025|bot=medic}}{{cbignore|bot=medic}} SC 42 meets face-to-face twice a year in an opening and closing plenary format with its subgroups meeting concurrently during the week. SC 42 organizes bi-annual AI workshops that target all stakeholders interested in AI and the committee's work.{{Cite web|url=https://jtc1info.org/technology/subcommittees/ai/workshops/|title=

ISO/IEC AI Workshops|website=jtc1info.org|language=en|access-date=2023-04-24}} {{Infobox organization

| image =

| caption =

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| formation = 2018

| extinction =

| type = Standards organization

| status =

| purpose = Development of worldwide standards for artificial intelligence

| headquarters =

| coords =

| language =

| leader_title = Chair

| leader_name = Wael William Diab{{Cite web|url=https://www.itu.int/en/ITU-T/academia/kaleidoscope/2013/Pages/DiabWW.aspx|title=Wael William Diab|website=www.itu.int|language=en|access-date=2023-06-06}}

| leader_title2 = Committee Manager

| leader_name2 = Heather Benko{{Cite web|url=https://www.iso.org/committee/6794475.html|title=ISO/IEC JTC 1/ SC 42|website=www.iso.org|language=en|access-date=2023-04-24}}

| key_people =

| main_organ =

| parent_organization = International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) JTC 1

| affiliations =

| budget =

| remarks =

| name = ISO/IEC JTC 1/SC 42 — Artificial Intelligence

| image_border =

| size =

| msize =

| mcaption =

| abbreviation =

| motto =

| location =

| region_served = Worldwide

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| website = {{URL|https://jtc1info.org/technology/subcommittees/ai/}}

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History

At the 32nd ISO/IEC JTC 1 Plenary in Vladivostok, Russia, Resolution 12 established SC 42 as a system integration entity for Artificial Intelligence. The resolution also appointed Mr. Wael William Diab as Chair of the SC and Ms. Heather Benko was appointed as the Committee Manager. The inaugural meeting was held in Beijing, China on April 18th – 20th.

Scope

The scope of ISO/IEC JTC 1/SC 42 is:{{Cite web|url=https://www.iso.org/committee/6794475.html|title=ISO/IEC JTC 1/SC 42 - Artificial intelligence|website=www.iso.org|language=en|access-date=2023-04-18}}

  • Standardization in the area of Artificial Intelligence
  • Serve as the focus and proponent for JTC 1's standardization program on Artificial Intelligence
  • Provide guidance to JTC 1, IEC, and ISO committees developing Artificial Intelligence applications

ISO/IEC JTC 1/SC 42 is set up as a Systems Integration Entity.

Members

Membership in SC 42 is open to any national body. A member can be either participating (P) or observing (O). The current list of countries active in SC 42 include:{{Cite web|url=https://www.iso.org/committee/6794475.html?view=participation|title=ISO/IEC JTC 1/SC 42 - Artificial intelligence|website=www.iso.org|language=en|access-date=2018-08-23}}

39 p-members: Australia (SA), Austria (ASI), Azerbaijan (AZSTAND), Belgium (NBN), Canada (SCC), China (SAC), Cyprus (CYS), Democratic Republic of the Congo (OCC), Denmark (DS), Egypt (EOS), Finland (SFS), France (AFNOR), Germany (DIN), India (BIS), Ireland (NSAI), Israel (SII), Italy (UNI), Japan (JISC), Kazakhstan (KAZMEMST), Korea, Republic of (KATS), Luxembourg (ILNAS), Malaysia (DSM), Malta (MCCAA), Netherlands (NEN), Norway (SN), Philippines (BPS), Portugal (IPQ), Russian Federation (GOST R), Rwanda (RSB), Saudi Arabia (SASO), Singapore (SSC), Slovakia (UNMS SR), Spain (UNE), Sweden (SIS), Switzerland (SNV), Turkey (TSE), Uganda (UNBS), United Kingdom (BSI), United States (ANSI), Zimbabwe (SAZ).

25 o-members

Structure

ISO/IEC JTC 1/SC 42 is currently made up of five working groups, each of which carries out specific tasks in standards development within the field of Artificial Intelligence. The working groups, study groups, and advisory group of ISO/IEC JTC 1/SC 42 are: [https://www.iso.org/committee/6794475.html#structure ISO/IEC JTC 1/SC 42 - Artificial intelligence]

class="wikitable"

!Working Group

!Title

!Convenor

WG 1

|Foundational standards

|Paul Cotton (Canada)

WG 2

|Big Data

|David Boyd (United States)

WG 3

|Trustworthiness

|David Filip (Ireland)

WG 4

|Use cases and applications

|Fumihiro Maruyama (Japan)

WG 5

|Computational approaches and characteristics of artificial intelligence systems

|Ning Sun (China)

The subcommittee also administers a number of Joint Work Groups with other subcommittees:

class="wikitable"

!Working Group

!Title

!Convenor

JWG 2

|With ISO/IEC JTC 1/SC 7: Testing of AI-based systems

|Adam Leon Smith (UK) and Stuart Reid (UK)

JWG 3

|With ISO/TC 215 WG: AI enabled health informatics

|Shushaku Tsumoto (Japan)

JWG 4

|With IEC/TC 65/SC 65A: Functional safety and AI systems

|Riccardo Mariani (Italy)

Collaborations

ISO/IEC JTC 1/SC 42 works in close collaboration with a number of other organizations or subcommittees, both internal and external to ISO and IEC. Organizations internal to ISO or IEC that collaborate with or are in liaison to SC 42 include:{{Cite web|url=https://www.iso.org/committee/6794475.html#liaisons|title=ISO/IEC JTC 1/SC 42 - Artificial intelligence|website=www.iso.org|language=en|access-date=2018-08-23}}

JTC 1 Committees and Groups

ISO Committees

IEC Committees

Organizations external to ISO or IEC that collaborate with or are in liaison with SC 42 include:

Category A Liaisons

ISO/IEC also collaborates with CEN/CENELEC through the Vienna Agreement,{{Cite web|url=https://www.cencenelec.eu/about-cen/cen-and-iso-cooperation/|title=CEN and ISO cooperation|language=en|access-date=2024-09-15}} specifically with CEN/CENELEC JTC 21, charged with writing standards to support the EU's Artificial Intelligence Act.

Standards

ISO/IEC JTC 1/SC 42 currently has published a number of standards, as well as various other standards or technical reports under development within the field of artificial intelligence. These include:{{Cite web|url=https://www.iso.org/committee/6794475/x/catalogue/p/1/u/1/w/0/d/0|title=ISO/IEC JTC 1/SC 42 - Artificial intelligence|website=www.iso.org|language=en|access-date=2018-08-23}}

class="wikitable sortable" width="100%"

! data-sort-type="number" width="14%" |ISO/IEC Standard

! width="30%" |Title

! width="6%" |Status

data-sort-value="20000-11" |ISO/IEC 5259-1

|ISO/IEC 5259-1: Data quality for analytics and machine learning — Part 1: Overview, terminology, and examples

|Published (2024)

data-sort-value="20000-11" |ISO/IEC 5259-3

|ISO/IEC 5259-3: Data quality for analytics and machine learning — Part 3: Data quality management requirements and guidelines

|Published (2024)

data-sort-value="20000-11" |ISO/IEC 5259-4

|ISO/IEC 5259-4: Data quality for analytics and machine learning — Part 4: Data quality process framework

|Published (2024)

data-sort-value="20000-02" |ISO/IEC 8183

|ISO/IEC 8183: Data life cycle framework

|Published (2023)

data-sort-value="20000-02" |ISO/IEC TS 8200

|ISO/IEC TS 8200: Controllability of automated AI systems

|Published (2024)

data-sort-value="20000-02" |ISO/IEC 17903

|ISO/IEC 17903: Overview of machine learning computing devices

|Published (2024)

data-sort-value="20000-03" |ISO/IEC 20546

|ISO/IEC 20547-1: Big data -- Overview and vocabulary

|Published (2019)

data-sort-value="20000-03" |ISO/IEC 20547-1

|ISO/IEC 20547-1: Big data reference architecture -- Part 1: Framework and application process

|Published (2020)

data-sort-value="20000-04" |ISO/IEC 20547-2

|ISO/IEC TR 20547-2:2018 : Big data reference architecture -- Part 2: Use cases and derived requirements

|Published (2018)

data-sort-value="20000-05" |ISO/IEC 20547-3

|ISO/IEC 20547-3: Big data reference architecture -- Part 3: Reference architecture

|Published (2020)

data-sort-value="20000-01" |ISO/IEC 20547-5

|ISO/IEC TR 20547-5:2018: Big data reference architecture -- Part 5: Standards roadmap

|Published (2018)

data-sort-value="20000-02" |ISO/IEC 20546

|ISO/IEC 20546: Big data -- Overview and vocabulary

|Published (2019)

data-sort-value="20000-06" |ISO/IEC 22989

|ISO/IEC 22989: Artificial Intelligence Concepts and Terminology

|Published (2022)

data-sort-value="20000-07" |ISO/IEC 23053

|ISO/IEC 23053: Framework for Artificial Intelligence (AI) Systems Using Machine Learning (ML)

|Published (2022)

data-sort-value="20000-08" |ISO/IEC 23894

|ISO/IEC 23894: Artificial intelligence - Guidance on risk management {{Cite web|url=https://aistandardshub.org/a-new-standard-for-ai-risk-management-0|title=A new standard for risk management of AI|website=aistandardshub.org|language=en|access-date=2023-11-24}}

|Published (2023)

data-sort-value="20000-08" |ISO/IEC TR 24027

|ISO/IEC TR 24027: Bias in AI systems and AI aided decision making {{Cite web|url=https://medium.com/e-tech/addressing-bias-in-artificial-intelligence-920b55c24d9a|title=Addressing bias in artificial intelligence|website=medium.com|language=en|access-date=2024-04-24}}

|Published (2021)

data-sort-value="20000-09" |ISO/IEC TR 24028

|ISO/IEC TR 24028: Overview of trustworthiness in artificial intelligence

|Published (2020)

data-sort-value="20000-08" |ISO/IEC TR 24368

|ISO/IEC TR 24368: Overview of ethical and societal concerns{{Cite web|url=https://www.iec.ch/blog/new-isoiec-report-offers-guidance-responsible-adoption-ai|title=New ISO/IEC report offers guidance on the responsible adoption of AI|website=www.iec.ch|language=en|access-date=2023-04-24}}

|Published (2022)

data-sort-value="20000-09" |ISO/IEC 24668

|ISO/IEC 24668: Process management framework for big data analytics

|Published (2022)

data-sort-value="20000-10" |ISO/IEC TS 4213

|ISO/IEC TS 4213: Assessment of Machine Learning Classification Performance{{Cite web|url=https://medium.com/e-tech/measuring-the-performance-of-ml-classification-6dbe27879d0e|title=Measuring the performance of ML classification|website=medium.com|language=en|access-date=2023-04-24}}

|Published (2022)

data-sort-value="20000-11" |ISO/IEC 24029-1

|ISO/IEC TR 24029-1: Assessment of the robustness of neural networks — Part 1: Overview

|Published (2021)

data-sort-value="20000-11" |ISO/IEC 24029-2

|ISO/IEC 24029-2: Assessment of the robustness of neural networks — Part 2: Methodology for the use of formal methods {{Cite web|url=https://www.iec.ch/blog/artificial-intelligence-enhancing-trustworthiness-neural-networks-0|title=Artificial intelligence: enhancing the trustworthiness of neural networks|website=iec.ch|language=en|access-date=2023-10-17}}

|Published (2023)

data-sort-value="20000-11" |ISO/IEC 24030

|ISO/IEC 24030: AI use cases

|Published (2024)

data-sort-value="20000-11" |ISO/IEC TS 25058

|ISO/IEC TS 25058: Systems and software Quality Requirements and Evaluation (SQuaRE) - Guidance for quality evaluation of AI systems

|Published (2024)

data-sort-value="20000-11" |ISO/IEC 25059

|ISO/IEC 25059: Systems and software Quality Requirements and Evaluation (SQuaRE) - Quality model for AI systems {{Cite web|url=https://www.iec.ch/blog/new-international-standard-ensuring-quality-ai-systems|title=New international standard for ensuring the quality of AI systems|website=iec.ch|language=en|access-date=2024-04-24}}

| Published (2023)

data-sort-value="20000-11" |ISO/IEC 42001

|ISO/IEC 42001: AI management system {{Cite web|url=https://www.iec.ch/blog/novel-ai-international-standard-enables-certification-and-responsible-adoption|title=Novel AI international standard that enables certification and responsible adoption|website=iec.ch|language=en|access-date=2024-04-24}}

|Published (2023)

data-sort-value="20000-11" |ISO/IEC 5338

|ISO/IEC 5338: AI system life cycle processes

|Published (2023)

data-sort-value="20000-11" |ISO/IEC 5339

|ISO/IEC 5339: Guidance for AI applications

|Published (2024)

data-sort-value="20000-11" |ISO/IEC 5392

|ISO/IEC 5392: Reference architecture of knowledge engineering

|Published (2024)

data-sort-value="20000-11" |ISO/IEC 5469

|ISO/IEC 5469: Functional safety and AI systems

|Published (2024)

Awards

In 2023, the ISO/IEC JTC 1/SC 42 has won ISO's Lawrence D. Eicher Award.{{cite web |title=Congratulations, AI Trailblazers! ISOIEC JTC 1SC 42 Receives Prestigious ISO Lawrence D. Eicher Award |url=https://www.ansi.org/standards-news/all-news/2023/09/9-22-23-congratulations-ai-trailblazers-isoiec-jtc-1sc-42-receives-prestigious-iso |website=American National Standards Institute - ANSI |access-date=18 October 2023 |language=en}}{{cite web |title=Artificial intelligence experts win prestigious ISO award |url=https://www.iso.org/news/awards/LDE-award-2023 |website=ISO |access-date=18 October 2023 |language=en |date=12 September 2023}}{{cite web |title=IEC leaders emphasize power of collaboration |url=https://iec.ch/blog/iec-leaders-emphasize-power-collaboration-iso-annual-meeting |website=iec.ch |access-date=18 October 2023 |language=en}}

See also

References