The technique encompasses but is not limited to instruments that use spectrally broadband, visible sources (white light) to achieve interference fringe localization. CSI uses either fringe localization alone or in combination with interference fringe phase, depending on the surface type, desired surface topography repeatability and software capabilities. The table below compiles alternative terms that conform at least in part to the above definition.
class="wikitable" |
Acronym | Term | Reference |
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CSI | Coherence scanning interferometry | [{{cite journal | last1 = Windecker | first1 = R. | last2 = Haible | first2 = P. | last3 = Tiziani | first3 = H. J. | year = 1995 | title = Fast Coherence Scanning Interferometry for Measuring Smooth, Rough and Spherical Surfaces | journal = Journal of Modern Optics | volume = 42 | issue = 10| pages = 2059–2069 | doi=10.1080/09500349514551791| bibcode = 1995JMOp...42.2059W }}] |
CPM | Coherence probe microscope | [{{cite journal | last1 = Davidson | first1 = M. | last2 = Kaufman | first2 = K. | last3 = Mazor | first3 = I. | year = 1987 | title = The Coherence Probe Microscope | journal = Solid State Technology | volume = 30 | issue = 9| pages = 57–59 }}] |
CSM | Coherence scanning microscope | [{{cite journal | last1 = Lee | first1 = B. S. | last2 = Strand | first2 = T. C. | year = 1990 | title = Profilometry with a coherence scanning microscope | journal = Appl Opt | volume = 29 | issue = 26| pages = 3784–3788 | doi=10.1364/ao.29.003784| pmid = 20567484 | bibcode = 1990ApOpt..29.3784L }}] |
CR | Coherence radar | [{{cite journal | last1 = Dresel | first1 = T. | last2 = Häusler | first2 = G. | last3 = Venzke | first3 = H. | year = 1992 | title = Three-dimensional sensing of rough surfaces by coherence radar | journal = Applied Optics | volume = 31 | issue = 7| pages = 919–925 | doi=10.1364/ao.31.000919| pmid = 20720701 | bibcode = 1992ApOpt..31..919D }}] |
CCI | Coherence correlation interferometry | [Lee-Bennett, I. (2004). Advances in non-contacting surface metrology. Optical Fabrication and Testing, OTuC1.] |
MCM | Mirau correlation microscope | [{{cite journal | last1 = Kino | first1 = G. S. | last2 = Chim | first2 = S. S. C. | year = 1990 | title = Mirau correlation microscope | journal = Applied Optics | volume = 29 | issue = 26| pages = 3775–83 | doi=10.1364/ao.29.003775| pmid = 20567483 | bibcode = 1990ApOpt..29.3775K }}] |
WLI | White light interferometry | [{{cite journal | last1 = Larkin | first1 = K. G. | year = 1996 | title = Efficient nonlinear algorithm for envelope detection in white light interferometry | journal = Journal of the Optical Society of America A | volume = 13 | issue = 4| page = 832 | doi = 10.1364/josaa.13.000832 | bibcode = 1996JOSAA..13..832L | citeseerx = 10.1.1.190.4728 }}] |
WLSI | White light scanning interferometry | [Wyant, J. C. (September, 1993). How to extend interferometry for rough-surface tests. Laser Focus World, 131-135.] |
SWLI | Scanning white light interferometry | [{{cite journal | last1 = Deck | first1 = L. | last2 = de Groot | first2 = P. | year = 1994 | title = High-speed noncontact profiler based on scanning white-light interferometry | journal = Applied Optics | volume = 33 | issue = 31| pages = 7334–7338 | doi=10.1364/ao.33.007334| pmid = 20941290 | bibcode = 1994ApOpt..33.7334D }}] |
WLS | White Light Scanner | |
WLPSI | White light phase shifting interferometry | [{{cite journal | last1 = Schmit | first1 = J. | last2 = Olszak | first2 = A. G. | editor1-first = Katherine | editor1-last = Creath | editor2-first = Joanna | editor2-last = Schmit | year = 2002 | title = Challenges in white-light phase-shifting interferometry | bibcode = 2002SPIE.4777..118S | journal = Proc. SPIE | volume = 4777 | pages = 118–127 | doi = 10.1117/12.472211 | series = Interferometry XI: Techniques and Analysis | s2cid = 128892213 }}] |
VSI | Vertical scanning interferometry | [{{cite journal | last1 = Harasaki | first1 = A. | last2 = Schmit | first2 = J. | last3 = Wyant | first3 = J. C. | year = 2000 | title = Improved vertical-scanning interferometry | journal = Applied Optics | volume = 39 | issue = 13| pages = 2107–2115 | doi=10.1364/ao.39.002107| pmid = 18345114 | bibcode = 2000ApOpt..39.2107H | hdl = 10150/289148 | hdl-access = free }}] |
RSP | Rough surface profiler | [{{cite journal | last1 = Caber | first1 = P. J. | year = 1993 | title = Interferometric profiler for rough surfaces | journal = Appl Opt | volume = 32 | issue = 19| pages = 3438–3441 | doi=10.1364/ao.32.003438| pmid = 20829962 | bibcode = 1993ApOpt..32.3438C}}] |
IRS | Infrared scanning | [{{cite journal | last1 = De Groot | first1 = P. | last2 = Biegen | first2 = J. | last3 = Clark | first3 = J. | last4 = Colonna | last5 = de Lega | first5 = X. | last6 = Grigg | first6 = D. | year = 2002 | title = Optical Interferometry for Measurement of the Geometric Dimensions of Industrial Parts | journal = Applied Optics | volume = 41 | issue = 19| pages = 3853–3860 | doi=10.1364/ao.41.003853| pmid = 12099592 | bibcode = 2002ApOpt..41.3853D }}] |
OCT | Full-field optical coherence tomography | [{{cite journal | last1 = Dubois | first1 = A | last2 = Vabre | first2 = L | last3 = Boccara | first3 = AC | last4 = Beaurepaire | first4 = E | year = 2002 | title = High-resolution full-field optical coherence tomography with a Linnik microscope | journal = Applied Optics | volume = 41 | issue = 4| pages = 805–12 | doi=10.1364/ao.41.000805 | pmid=11993929| bibcode = 2002ApOpt..41..805D }}] |