VIEW Engineering
{{Infobox company
| name =
| logo = VIEW Logo circa 2000b.jpg
| logo_size = 220px
| caption =
| type = Private
| traded_as =
| fate = Renamed to VIEW Micro-Metrology (2008)
| predecessor =
| successor =
| foundation = Canoga Park, California ({{Start date|1976|03|09}})
| founder = Dr. Richard Hubach
Jack Sacks
Veeder South
| defunct =
| location_city = Tempe, Arizona
| location_country = United States
| location =
| locations = 1 facility (2011)
| area_served = Worldwide
| key_people =
| industry = Semiconductor device fabrication
Integrated circuit packaging
Printed circuit board
Computer data storage
Precision assembly & fabrication
| products = Machine vision systems
Coordinate-measuring machines
Automated optical inspection systems
| services =
| revenue =
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| assets =
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| owner =
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| parent = Quality Vision International, Inc.
| divisions =
| subsid =
| homepage = {{URL|www.viewmm.com}}
| footnotes =
| intl =
}}
VIEW Engineering was one of the first manufacturers of commercial machine vision systems.{{cite web|title=About VIEW Micro-Metrology|url=http://www.viewmm.com/about.jsp|publisher=VIEW Micro-Metrology|accessdate=7 July 2011}} These systems provided automated dimensional measurement, defect detection, alignment and quality control capabilities. They were used primarily in the Semiconductor device fabrication, Integrated circuit packaging, Printed circuit board, Computer data storage and Precision assembly / fabrication industries.{{cite web|title=VIEW Micro-Metrology Applications|url=http://www.viewmm.com/mm_apps.jsp|publisher=VIEW Micro-Metrology|accessdate=7 July 2011}} VIEW's systems used video and laser technologies to perform their functions without touching the parts being examined.
History
= 1976 origins =
Image:VIEW Logo circa 1976.jpg
Image:VIEW Engineering Logo circa 1996.jpg
While working as a physicist at Hughes Aircraft Company, Dick Hubach recognized a need for automated dimensional measurement systems, when he discovered that the cost to verify the correct manufacture of some aerospace components actually exceeded the cost to manufacture those components.{{cite web|title=VIEW Ugly Duckling PDF Document|url=https://drive.google.com/open?id=0B38vY4sdZ6JXN2JiTzFDbnVjZ0E|publisher=VIEW Micro-Metrology|accessdate=12 July 2011}} This recognition led to a new start-up company named VIEW Engineering.
VIEW Engineering was founded in Canoga Park, California in 1976. The next year, VIEW introduced the word's first automated, 3-axis, machine vision-based, dimensional measurement system – the RB-1.{{cite web|title=History of VIEW Micro-Metrology|url=http://www.viewmm.com/history.jsp|publisher=VIEW Micro-Metrology|accessdate=9 July 2011}} The RB-1 was the forerunner of modern machine vision-based Coordinate-measuring machines (CMMs). This was followed in 1978 by the introduction of the first pattern recognition (Template matching) system for automated Wirebonding machines and Wafer probers – the PR-1.
= Growth =
As the company's business increased, VIEW Engineering relocated to a facility in Chatsworth, California in late 1977 and again to Simi Valley, California in 1981.{{cite web|title=VIEW Engineering, Inc, Simi Valley|url=http://www.techspex.com/techspex/suppliers/info?company_id=5354|publisher=Techspex|accessdate=7 July 2011}}
General Motors Corporation invested in VIEW Engineering in 1984{{cite web|title=GM Corp acquires a minority stake in VIEW Engineering Inc|url=http://www.alacrastore.com/storecontent/Thomson_M&A/General_Motors_Corp_acquires_a_minority_stake_in_View_Engineering_Inc-161019043|publisher=Thomson Financial Mergers & Acquisitions|accessdate=7 July 2011}} as part of its plan to improve automobile manufacturing quality in the U.S. through widespread use of factory floor machine vision technology. In 1989, VIEW Engineering purchased Synthetic Vision Systems, Inc.{{cite web|title=VIEW Engineering Inc acquires Synthetic Vision Systems|url=http://www.alacrastore.com/storecontent/Thomson_M&A/View_Engineering_Inc_acquires_Synthetic_Vision_Systems-241296020|publisher=Thomson Financial Mergers & Acquisitions|accessdate=7 July 2011}}
VIEW Engineering was an OEM for Mitutoyo in the late 1980s. This relationship was concluded when Mitutoyo licensed VIEW's machine vision technology in 1994. This licensed technology became the foundation for Mitutoyo's video and laser-based CMMs.{{cite web|title=Mitutoyo Company UK, Mitutoyo Worldwide, Section 9, 2nd Paragraph|url=http://www.mitutoyo.co.uk/Mite/mws.jsp?WorldWide|publisher=Mitutoyo UK|accessdate=13 July 2011}}
In 1996, Robotic Vision Systems, Inc. (RVSI) first brought a patent infringement lawsuit against VIEW Engineering related to the coplanarity measurement of packaged semiconductor devices.{{cite web|title=189 F3d 1370 Robotic Vision Systems Inc v VIEW Engineering Inc|url=http://openjurist.org/189/f3d/1370/robotic-vision-systems-inc-v-view-engineering-inc|publisher=OpenJurist|accessdate=14 July 2011}} In 2000, RVSI's patent was finally declared invalid and the U.S. District Court for the Central District of California ruled in favor of VIEW Engineering.{{cite web|title=Court Decides on Machine Vision Patent Suit|url=http://www.sme.org/cgi-bin/get-press.pl?&&20001737&April%206,%202000&&SME&|publisher=Society of Manufacturing Engineers|accessdate=14 July 2011}} Even after this ruling, RVSI contemplated continuing its appeals through 2001.{{cite web|title=Robotic Vision Systems Inc Says It May Appeal in Patent Infringement Suit|url=http://www.machinevisiononline.org/vision-resources-details.cfm/Machine-Vision-Online/Robotic-Vision-Systems-Inc-Says-it-May-Appeal-in-Patent-Infringement-Suit/content_id/1757|publisher=MachineVisionOnline|accessdate=14 July 2011}}
= 1996 purchase and continued existence =
Also in 1996, VIEW Engineering was purchased by General Scanning, Inc. (GSI).{{cite web|title=General Scanning Inc acquires VIEW Engineering Inc|url=http://www.alacrastore.com/storecontent/Thomson_M&A/General_Scanning_Inc_acquires_View_Engineering_Inc-549072020|publisher=Thomson Financial Mergers & Acquisitions|accessdate=7 July 2011}} Quality Vision International, Inc. (QVI) purchased the company from GSI Lumonics (previously GSI) in 2000.{{cite web|title=GSI Lumonics announces the sale of its Metrology Product Line to QVI|url=http://www2.prnewswire.com/cgi-bin/stories.pl?ACCT=104&STORY=/www/story/04-20-2000/0001197109&EDATE=|publisher=PRNewswire|accessdate=7 July 2011}} In 2005, QVI combined VIEW Engineering with Micro Metric, Inc. of San Jose, California, and in 2008 renamed the new company "VIEW Micro-Metrology." In 2009, VIEW's California operations were relocated to QVI's Western Region facility in Tempe, Arizona.
VIEW Micro-Metrology continues to be global supplier of high-accuracy video coordinate measuring systems and software, primarily serving micro-electronic, mobile device and data storage manufacturing.{{cite web|title=VIEW Micro-Metrology|url=http://www.viewmm.com/|publisher=VIEW Micro-Metrology|accessdate=7 July 2011}}
Product timeline
Image:VIEW Pattern Recognition.jpg
Image:VIEW Engineering CMM.jpg
Image:VIEW shaft measurement CMM.jpg
- 1977: VIEW RB-1 – An automated, 3-axis, binary image, machine vision-based, dimensional measurement system (a forerunner of modern machine vision-based CMMs)
- 1978: VIEW PR-1 – A binary image, pattern recognition system for automated Wirebonding machines and Wafer probers
- 1981: VIEW 719 – A general-purpose, binary image, machine vision system for shop floor use
- 1982: VIEW 1101 – A 2nd generation, binary image, pattern recognition system for automated Wirebonding machines and Wafer probers
- 1982: VIEW 1119 – A combination of the 719 and the 1101 that provided pattern recognition and edge detection capabilities
- 1982: VIEW 1200 – A binary image, machine vision-based CMM
- 1985: VIEW 720 – A 2nd generation, general-purpose, grayscale image, machine vision system for shop floor use
- 1985: VIEW 1220 – A 2nd generation, grayscale image, machine vision-based CMM
- 1986: VIEW 725 – A dedicated machine vision system for QFP (Quad Flat Package) and PLCC (Plastic leaded chip carrier) package inspection
- 1987: VIEW Précis 3000 – A large-travel, machine-vision-based CMM
- 1988: VIEW Bazic8 & Bazic12 – Machine vision-based CMMs
- 1989: VIEW Ultra8 – A high-accuracy (sub-micron), machine vision-based CMM
- 1990: VIEW 7100 – A 2nd generation, machine vision system for QFP and PLCC package inspection
- 1993: VIEW Voyager 6x12, Voyager 12x12 & Voyager 18x18 – Machine vision-based CMMs
- 1994: VIEW 830 – A laser-based, 3D scanner system for PGA (Pin grid array) package inspection
- 1995: VIEW 8100 – A laser-based, 3D scanner system for SMT (Surface-mount technology) process characterization and control
- 1995: VIEW 880 – A laser-based, 3D scanner system for in-tray inspection of QFP, TQFP (Thin Quad Flat Pack), TSOP (Thin small-outline package) and BGA (Ball grid array) packages
- 1997: VIEW 890 – A laser-based, 3D scanner system for bump-on-die (Flip chip) inspection
- 1999: VIEW Pinnacle 250 – A high-accuracy, machine vision-based CMM
- 2001: VIEW Summit 450 & Summit 600 – High-accuracy, large-travel, machine vision-based CMMs
Patents
;VIEW Engineering's patents related to correlation-based pattern recognition were the foundation of the company's beginnings:
- Correlation-based Pattern Recognition hardware and software to find the position of specific, complex part features in video images. (United States Patent 4200861 & 4736437 & 4385322 & 4300164){{cite web|title=VIEW Engineering Assignee Patent Directory Page 1|url=http://www.patentmaps.com/assignee/View_Engineering_1.html|publisher=Patentmaps|accessdate=10 July 2011}}
;A number of VIEW Engineering's 31 patents address key video technologies useful in machine vision-based CMMs including:
- Programmable Ring Light{{cite web|title=Illumination|url=http://www.viewmm.com/illumination.jsp|publisher=VIEW Micro-Metrology|accessdate=10 July 2011}} hardware to enhance the appearance of weak-edges in video images by controlling illumination intensity, direction, color and angle of incidence. (United States Patent 4706168) (Japan Patent 2001-324450){{cite web|title=VIEW Engineering Assignee Patent Directory Page 2|url=http://www.patentmaps.com/assignee/View_Engineering_2.html|publisher=Patentmaps|accessdate=10 July 2011}} (China Patent 200810207342) (Canada Patent CA 1293232){{cite web|title=VIEW Engineering Assignee Patent Directory Page 3|url=http://www.patentmaps.com/assignee/View_Engineering_3.html|publisher=Patentmaps|accessdate=10 July 2011}}
- Automatic, Video-based, Camera Focusing to determine the Z-axis position of an object under inspection. (United States Patent 4920273) (Canada Patent CA 1255796){{cite web|title=VIEW Engineering Assignee Patent Directory Page 4|url=http://www.patentmaps.com/assignee/View_Engineering_4.html|publisher=Patentmaps|accessdate=10 July 2011}}
- Ronchi Grid Surface Focus{{cite web|title=Ronchi Grid|url=http://www.viewmm.com/ronchi_grid.jsp|publisher=VIEW Micro-Metrology|accessdate=10 July 2011}} hardware to allow automatic camera-focusing on reflective or low-texture surfaces. (United States Patent 4743771)
;Other VIEW Engineering patents relate to the 3D laser-scanning technology used in VIEW's PGA, QFP, TQFP, TSOP and BGA package inspection systems:
References
{{reflist}}
External links
- {{Official website|http://www.viewengineering.com/}}
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Category:Commercial computer vision systems
Category:Instrument-making corporations
Category:Manufacturing companies based in California
Category:Technology companies based in Greater Los Angeles
Category:Canoga Park, Los Angeles
Category:Computer companies established in 1976